"Handbook of Plasma Immersion Ion Implantation & Deposition" (PIII&D)

A Wiley Interscience Publication,  A Division of John Wiley & Sons, New York, September 2000.  ISBN 0-471-24698-0
approximately 760 pages, cloth.

US $150.00 (+tax and shipping costs, if applicable).

The Handbook at Wiley's page.

Read Excerpt (PDF).

André Anders is the editor and a co-author, and 28 other scientists and engineers from six countries have contributed to the book project.

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2) Contact Wi5 Ionized Magnetron Sputtering
7.9.5 Thermal and Electron Beam Evaporation

References for Chapter 7

Chapter 8.  Pulser Technology

D. M. Goebel*, R.J. Adler, D.F. Beals, W. A. Reass
8.1 General Design Considerations for PIII&D Pulsers
8.1.1 Introduction
8.1.2 Pulser Impedance
8.1.3 Pulser Circuits
8.2 Hard Tube Pulsers
8.2.1 Introduction: Advantages of Hard Tube Pulsers
8.2.2 Hard-Vacuum Tube Types
8.2.3 Hard Tube Modulator Circuits
8.3 Pulsers Based on Thyratrons with Pulse Forming Networks
8.3.1 Introduction: Advantages of Thyratron Switches
8.3.2 Combining Thyratrons and Pulse Forming Networks
8.3.3 Characteristics of Pulse Forming Networks
8.4 Solid State Modulators
8.4.1 Introduction: Advantages of Solid-State Pulsers
8.4.2 Circuits for High-Power Solid-State Pulsers
8.4.3 Insulated Gate Bipolar Transistors (IGBT)
8.4.4 Thyristors (SCR)
8.4.5 Gate Turn-Off Devices (GTO)
8.4.6 Metal Oxide Field Effect Transistors (MOSFET)
8.4.7 Bipolar Transistors
8.4.8 Power Considerations and Limitations of Solid State Devices
8.4.9 Protection and Implementation of Solid State Devices
8.4.10 Device Drive Circuits
8.5 Pulse Transformer Design for PIII&D
8.5.1 Introduction: Use of Pulse Transformers
8.5.2 Transformer Design
8.5.3 Example of Empire Hard Chrome Pulser
8.5.4 General Purpose IGBT/Transformer Pulser
8.5.5 Hard-Tube/Transformer Pulser
8.5.6 High-Voltage/Transformer Pulser
References for Chapter 8

Chapter 9.  Health and Safety Issues Related to PIII&D

D.F. Beals*, A. Anders, J. Matossian
9.1 Introduction
9.2 Electrical Safety
9.2.1 Voltage, Current and Stored Energy
9.2.2 Capacitively Stored Energy
9.2.3 Inductivelquasi-uniform, axially directed magnetic fields
c) ECR discharges
7.6.3.2 Sources Using Antenna Applicators
a) Magnetic field-free discharges (B0 = 0)
b) Discharges utilizing multipole magnetic fields
7.6.4 Scaling-Up of Microwave Plasma Sources
7.6.4.1 Magnetic Field-Free Discharges (B0 = 0)
a) Transmission-line plasma sources: surface-wave discharges
b) Antenna-sustained plasma sources
7.6.4.2 Discharges Confined by Quasi-Uniform Magnetic Fields
7.6.4.3 Discharges Confined by Multipolar Magnetic Fields
7.6.5 Perspectives for Microwave Discharges and Multipole Plasmas in PIII&D
7.7 Remote Gas Plasma Sources
7.7.1 Introduction
7.7.2 Streaming Plasma from a Filament Source
7.7.3 End-Hall Plasma Source
7.7.4 Constricted Plasma Source
7.8 Cathodic Arc Metal Plasma Sources and Macroparticle Filters
7.8.1 Introduction
7.8.2 Short-Pulse Cathodic Arc Plasma Sources
7.8.3 Long-Pulse and DC Cathodic Arc Plasma Sources
7.8.4 Macroparticle Filtering
7.9 Other Sources of Plasma and Vapor
7.9.1 Spotless Cathodic Arcs
7.9.2 Anodic Vacuum Arcs
7.9.3 Laser Plasma Source
7.9.4 Sputtering
7.9.4.1 Introduction
7.9.4.2 Magnetron Sputtering
7.9.4.3 Unbalanced Magnetron Sputtering
7.9.4.4 Reactive Magnetron Sputtering, including RF, Pulsed DC, and AC Dual Magnetron Sputtering
7.9.4.5 Ionized Magnetron Sputtering
7.9.5 Thermal and Electron Beam Evaporation
References for Chapter 7

Chapter 8.  Pulser Technology

D. M. Goebel*, R.J. Adler, D.F. Beals, W. A. Reass
8.1 General Design Considerations for PIII&D Pulsers
8.1.1 Introduction
8.1.2 Pulser Impedance
8.1.3 Pulser Circuits
8.2 Hard Tube Pulsers
8.2.1 Introduction: Advantages of Hard Tube Pulsers
8.2.2 Hard-Vacuum Tube Types
8.2.3 Hard Tube Modulator Circuits
8.3 Pulsers Based on Thyratrons with Pulse Forming Networks
8.3.1 Introduction: Advantages of Thyratron Switches
8.3.2 Combining Thyratrons and Pulse Forming Networks
8.3.3 Characteristics of Pulse Forming Networks
8.4 Solid State Modulators
8.4.1 Introduction: Advantages of Solid-State Pulsers
8.4.2 Circuits for High-Power Solid-State Pulsers
8.4.3 Insulated Gate Bipolar Transistors (IGBT)
8.4.4 Thyristors (SCR)
8.4.5 Gate Turn-Off Devices (GTO)
8.4.6 Metal Oxide Field Effect Transistors (MOSFET)
8.4.7 Bipolar Transistors
8.4.8 Power Considerations and Limitations of Solid State Devices
8.4.9 Protection and Implementation of Solid State Devices
8.4.10 Device Drive Circuits
8.5 Pulse Transformer Design for PIII&D
8.5.1 Introduction: Use of Pulse Transformers
8.5.2 Transformer Design
8.5.3 Example of Empire Hard Chrome Pulser
8.5.4 General Purpose IGBT/Transformer Pulser
8.5.5 Hard-Tube/Transformer Pulser
8.5.6 High-Voltage/Transformer Pulser
References for Chapter 8

Chapter 9.  Health and Safety Issues Related to PIII&D

D.F. Beals*, A. Anders, J. Matossian
9.1 Introduction
9.2 Electrical Safety
9.2.1 Voltage, Current and Stored Energy
9.2.2 Capacitively Stored Energy
9.2.3 Inductivelquasi-uniform, axially directed magnetic fields
c) ECR discharges
7.6.3.2 Sources Using Antenna Applicators
a) Magnetic field-free discharges (B0 = 0)
b) Discharges utilizing multipole magnetic fields
7.6.4 Scaling-Up of Microwave Plasma Sources
7.6.4.1 Magnetic Field-Free Discharges (B0 = 0)
a) Transmission-line plasma sources: surface-wave discharges
b) Antenna-sustained plasma sources
7.6.4.2 Discharges Confined by Quasi-Uniform Magnetic Fields
7.6.4.3 Discharges Confined by Multipolar Magnetic Fields
7.6.5 Perspectives for Microwave Discharges and Multipole Plasmas in PIII&D
7.7 Remote Gas Plasma Sources
7.7.1 Introduction
7.7.2 Streaming Plasma from a Filament Source
7.7.3 End-Hall Plasma Source
7.7.4 Constricted Plasma Source
7.8 Cathodic Arc Metal Plasma Sources and Macroparticle Filters
7.8.1 Introduction
7.8.2 Short-Pulse Cathodic Arc Plasma Sources
7.8.3 Long-Pulse and DC Cathodic Arc Plasma Sources
7.8.4 Macroparticle Filtering
7.9 Other Sources of Plasma and Vapor
7.9.1 Spotless Cathodic Arcs
7.9.2 Anodic Vacuum Arcs
7.9.3 Laser Plasma Source
7.9.4 Sputtering
7.9.4.1 Introduction
7.9.4.2 Magnetron Sputtering
7.9.4.3 Unbalanced Magnetron Sputtering
7.9.4.4 Reactive Magnetron Sputtering, including RF, Pulsed DC, and AC Dual Magnetron Sputtering
7.9.4.5 Ionized Magnetron Sputtering
7.9.5 Thermal and Electron Beam Evaporation
References for Chapter 7

Chapter 8.  Pulser Technology

D. M. Goebel*, R.J. Adler, D.F. Beals, W. A. Reass
8.1 General Design Considerations for PIII&D Pulsers
8.1.1 Introduction
8.1.2 Pulser Impedance
8.1.3 Pulser Circuits
8.2 Hard Tube Pulsers
8.2.1 Introduction: Advantages of Hard Tube Pulsers
8.2.2 Hard-Vacuum Tube Types
8.2.3 Hard Tube Modulator Circuits
8.3 Pulsers Based on Thyratrons with Pulse Forming Networks
8.3.1 Introduction: Advantages of Thyratron Switches
8.3.2 Combining Thyratrons and Pulse Forming Networks
8.3.3 Characteristics of Pulse Forming Networks
8.4 Solid State Modulators
8.4.1 Introduction: Advantages of Solid-State Pulsers
8.4.2 Circuits for High-Power Solid-State Pulsers
8.4.3 Insulated Gate Bipolar Transistors (IGBT)
8.4.4 Thyristors (SCR)
8.4.5 Gate Turn-Off Devices (GTO)
8.4.6 Metal Oxide Field Effect Transistors (MOSFET)
8.4.7 Bipolar Transistors
8.4.8 Power Considerations and Limitations of Solid State Devices
8.4.9 Protection and Implementation of Solid State Devices
8.4.10 Device Drive Circuits
8.5 Pulse Transformer Design for PIII&D
8.5.1 Introduction: Use of Pulse Transformers
8.5.2 Transformer Design
8.5.3 Example of Empire Hard Chrome Pulser
8.5.4 General Purpose IGBT/Transformer Pulser
8.5.5 Hard-Tube/Transformer Pulser
8.5.6 High-Voltage/Transformer Pulser
References for Chapter 8

Chapter 9.  Health and Safety Issues Related to PIII&D

D.F. Beals*, A. Anders, J. Matossian
9.1 Introduction
9.2 Electrical Safety
9.2.1 Voltage, Current and Stored Energy
9.2.2 Capacitively Stored Energy
9.2.3 Inductivelquasi-uniform, axially directed magnetic fields
c) ECR discharges
7.6.3.2 Sources Using Antenna Applicators
a) Magnetic field-free discharges (B0 = 0)
b) Discharges utilizing multipole magnetic fields
7.6.4 Scaling-Up of Microwave Plasma Sources
7.6.4.1 Magnetic Field-Free Discharges (B0 = 0)
a) Transmission-line plasma sources: surface-wave discharges
b) Antenna-sustained plasma sources
7.6.4.2 Discharges Confined by Quasi-Uniform Magnetic Fields
7.6.4.3 Discharges Confined by Multipolar Magnetic Fields
7.6.5 Perspectives for Microwave Discharges and Multipole Plasmas in PIII&D
7.7 Remote Gas Plasma Sources
7.7.1 Introduction
7.7.2 Streaming Plasma from a Filament Source
7.7.3 End-Hall Plasma Source
7.7.4 Constricted Plasma Source
7.8 Cathodic Arc Metal Plasma Sources and Macroparticle Filters
7.8.1 Introduction
7.8.2 Short-Pulse Cathodic Arc Plasma Sources
7.8.3 Long-Pulse and DC Cathodic Arc Plasma Sources
7.8.4 Macroparticle Filtering
7.9 Other Sources of Plasma and Vapor
7.9.1 Spotless Cathodic Arcs
7.9.2 Anodic Vacuum Arcs
7.9.3 Laser Plasma Source
7.9.4 Sputtering
7.9.4.1 Introduction
7.9.4.2 Magnetron Sputtering
7.9.4.3 Unbalanced Magnetron Sputtering
7.9.4.4 Reactive Magnetron Sputtering, including RF, Pulsed DC, and AC Dual Magnetron Sputtering
7.9.4.5 Ionized Magnetron Sputtering
7.9.5 Thermal and Electron Beam Evaporation
References for Chapter 7

Chapter 8.  Pulser Technology

D. M. Goebel*, R.J. Adler, D.F. Beals, W. A. Reass
8.1 General Design Considerations for PIII&D Pulsers
8.1.1 Introduction
8.1.2 Pulser Impedance
8.1.3 Pulser Circuits
8.2 Hard Tube Pulsers
8.2.1 Introduction: Advantages of Hard Tube Pulsers
8.2.2 Hard-Vacuum Tube Types
8.2.3 Hard Tube Modulator Circuits
8.3 Pulsers Based on Thyratrons with Pulse Forming Networks
8.3.1 Introduction: Advantages of Thyratron Switches
8.3.2 Combining Thyratrons and Pulse Forming Networks
8.3.3 Characteristics of Pulse Forming Networks
8.4 Solid State Modulators
8.4.1 Introduction: Advantages of Solid-State Pulsers
8.4.2 Circuits for High-Power Solid-State Pulsers
8.4.3 Insulated Gate Bipolar Transistors (IGBT)
8.4.4 Thyristors (SCR)
8.4.5 Gate Turn-Off Devices (GTO)
8.4.6 Metal Oxide Field Effect Transistors (MOSFET)
8.4.7 Bipolar Transistors
8.4.8 Power Considerations and Limitations of Solid State Devices
8.4.9 Protection and Implementation of Solid State Devices
8.4.10 Device Drive Circuits
8.5 Pulse Transformer Design for PIII&D
8.5.1 Introduction: Use of Pulse Transformers
8.5.2 Transformer Design
8.5.3 Example of Empire Hard Chrome Pulser
8.5.4 General Purpose IGBT/Transformer Pulser
8.5.5 Hard-Tube/Transformer Pulser
8.5.6 High-Voltage/Transformer Pulser
References for Chapter 8

Chapter 9.  Health and Safety Issues Related to PIII&D

D.F. Beals*, A. Anders, J. Matossian
9.1 Introduction
9.2 Electrical Safety
9.2.1 Voltage, Current and Stored Energy
9.2.2 Capacitively Stored Energy
9.2.3 Inductivelquasi-uniform, axially directed magnetic fields
c) ECR discharges
7.6.3.2 Sources Using Antenna Applicators
a) Magnetic field-free discharges (B0 = 0)
b) Discharges utilizing multipole magnetic fields
7.6.4 Scaling-Up of Microwave Plasma Sources
7.6.4.1 Magnetic Field-Free Discharges (B0 = 0)
a) Transmission-line plasma sources: surface-wave discharges
b) Antenna-sustained plasma sources
7.6.4.2 Discharges Confined by Quasi-Uniform Magnetic Fields
7.6.4.3 Discharges Confined by Multipolar Magnetic Fields
7.6.5 Perspectives for Microwave Discharges and Multipole Plasmas in PIII&D
7.7 Remote Gas Plasma Sources
7.7.1 Introduction
7.7.2 Streaming Plasma from a Filament Source
7.7.3 End-Hall Plasma Source
7.7.4 Constricted Plasma Source
7.8 Cathodic Arc Metal Plasma Sources and Macroparticle Filters
7.8.1 Introduction
7.8.2 Short-Pulse Cathodic Arc Plasma Sources
7.8.3 Long-Pulse and DC Cathodic Arc Plasma Sources
7.8.4 Macroparticle Filtering
7.9 Other Sources of Plasma and Vapor
7.9.1 Spotless Cathodic Arcs
7.9.2 Anodic Vacuum Arcs
7.9.3 Laser Plasma Source
7.9.4 Sputtering
7.9.4.1 Introduction
7.9.4.2 Magnetron Sputtering
7.9.4.3 Unbalanced Magnetron Sputtering
7.9.4.4 Reactive Magnetron Sputtering, including RF, Pulsed DC, and AC Dual Magnetron Sputtering
7.9.4.5 Ionized Magnetron Sputtering
7.9.5 Thermal and Electron Beam Evaporation
References for Chapter 7

Chapter 8.  Pulser Technology

D. M. Goebel*, R.J. Adler, D.F. Beals, W. A. Reass
8.1 General Design Considerations for PIII&D Pulsers
8.1.1 Introduction
8.1.2 Pulser Impedance
8.1.3 Pulser Circuits
8.2 Hard Tube Pulsers
8.2.1 Introduction: Advantages of Hard Tube Pulsers
8.2.2 Hard-Vacuum Tube Types
8.2.3 Hard Tube Modulator Circuits
8.3 Pulsers Based on Thyratrons with Pulse Forming Networks
8.3.1 Introduction: Advantages of Thyratron Switches
8.3.2 Combining Thyratrons and Pulse Forming Networks
8.3.3 Characteristics of Pulse Forming Networks
8.4 Solid State Modulators
8.4.1 Introduction: Advantages of Solid-State Pulsers
8.4.2 Circuits for High-Power Solid-State Pulsers
8.4.3 Insulated Gate Bipolar Transistors (IGBT)
8.4.4 Thyristors (SCR)
8.4.5 Gate Turn-Off Devices (GTO)
8.4.6 Metal Oxide Field Effect Transistors (MOSFET)
8.4.7 Bipolar Transistors
8.4.8 Power Considerations and Limitations of Solid State Devices
8.4.9 Protection and Implementation of Solid State Devices
8.4.10 Device Drive Circuits
8.5 Pulse Transformer Design for PIII&D
8.5.1 Introduction: Use of Pulse Transformers
8.5.2 Transformer Design
8.5.3 Example of Empire Hard Chrome Pulser
8.5.4 General Purpose IGBT/Transformer Pulser
8.5.5 Hard-Tube/Transformer Pulser
8.5.6 High-Voltage/Transformer Pulser
References for Chapter 8

Chapter 9.  Health and Safety Issues Related to PIII&D

D.F. Beals*, A. Anders, J. Matossian
9.1 Introduction
9.2 Electrical Safety
9.2.1 Voltage, Current and Stored Energy
9.2.2 Capacitively Stored Energy
9.2.3 Inductively Stored Energy
9.2.4 General Safety Precautions Related to Stored Energy
9.2.4 Safety Precautions Related to Stored Energy
9.2.5 Lockout and Tagout Procedures ("LOTO")
9.2.6 Safety Grounding Practices
9.2.7 Equipment Grounding
9.2.8 Equipment Interlocks and Safety Interlock Systems
9.3 Electromagnetic Radiation Safety
9.3.1 Some Definitions and Relevant Considerations
9.3.2 Non-Ionizing Radiation
9.3.2.1 Dangers of Non-Ionizing Radiation
9.3.2.2 Sub-Radiofrequency Fields
9.3.2.3 Radiofrequency, Microwave, and Infrared Radiation
9.3.2.4 Laser Radiation
9.3.2.5 Near Ultraviolet Radiation
9.3.3 Ionizing Radiation
9.3.3.1 Introduction and Definitions
9.3.3.2 Maximum Doses
9.3.3.3 Generation of Far-UV and X-Ray Radiation
9.3.3.4 Shielding of X-Ray Radiation
9.4 Vacuum and Chamber Safety
9.4.1 Implosion Hazards
9.4.2 Chamber Entry and Confined Space Hazards
9.4.3 Compressed Gas Containers
9.5 Chemical Safety
9.5.1 Classification of Chemicals and Sources of Information
9.5.2 Solvents and Other Liquids
9.5.3 Gases and Fumes
9.5.4 Cryogenics
References for Chapter 9

PART III - APPLICATIONS

Chapter 10. Metallurgical and other Non-Semiconductor Applications

K. Sridharan*, S. Anders, M. Nastasi, K.C. Walter, A. Anders, O.R. Monteiro, and W.J. Ensinger
10.1 Reduction of Wear and Corrosion
10.1.1 Introduction
10.1.2 Improvements of Wear Resistance
10.1.3 Improvements of Corrosion Resistance
10.1.4 Results of Industrial Field Tests
10.2 Diamond-Like Carbon Coatings
10.2.1 Introduction to Hard Carbon Films
10.2.2 Preparation of DLC by PIIID
10.2.3 Enhancement of Adhesion of DLC Coatings
10.2.4 Microstructure and Characterization of DLC Coatings
10.2.5 Properties of DLC Coatings
10.3 Hydrogen-Free Hard Carbon Films (a-C)
10.3.1 Synthesis of a-C Films
10.3.2 Deposition and Properties of a-C Films synthesized by Cathodic Arc Carbon Plasmas
10.3.3 Amorphous Hard Carbon for Tribological Applications in the Magnetic Storage Industry
10.4 Deposition of other Protective Coatings
10.4.1 Plasma Immersion Ion Implantation in Combination with Thin Film Deposition
10.4.2 Post-Deposition PIII-Treatment of Coatings
10.4.3 Deposition and PIII-Treatment as In-Line Process
10.4.4 Triode Sputter Deposition
10.4.5 Metal Plasma Immersion Ion Implantation and Deposition
10.4.6 Summarizing Remarks
10.5 Modification of Battery Electrodes
10.5.1 Introduction
10.5.2 Nickel Alkaline-Electrolyte Cells
10.5.3 Lithium Cells
10.5.4 Lead Acid Cells
10.6 Modification of Polymer Surfaces
10.6.1 Introduction
10.6.2 Modification of the Wettability of Polystyrene Surfaces
10.6.3 Protection of Polymers from Severe Oxidizing Environments
10.6.4 Improvement of Polymer Wear Resistance by Mesh-Assisted PIII
References for Chapter 10

Chapter 11. Semiconductor Applications

P.K. Chu*, N.W. Cheung, C. Chan, B. Mizuno, O.R. Monteiro
11.1 Introduction to PIII Semiconductor Applications
11.2 Shallow Junction Formation
11.2.1 Shallow Junctions Formed by PIII
11.2.2 PIII of BF3 / SiF4
11.2.3 Doping Using Hydrides
11.2.4 Contamination Studies
11.3 Flat-Panel Displays
11.4 Silicon-on-Insulator (SOI) Fabrication
11.4.1 Introduction to SOI Fabrication Processes
11.4.2 SPIMOX (Separation by Plasma Implantation of Oxygen)
11.4.3 SPIMOX Using a Water Plasma
11.4.4 Ion-Cut and Bonded SOI
11.5 Microcavity Engineering
11.5.1 Gettering Effects
11.5.2 Buried Light Emitting Porous Silicon
11.6 Trench Doping
11.7 Metallization Technology for Deep Trench Filling
11.8 Conclusions
References for Chapter 11

Appendix A. Survey of PIII&D Intellectual Property

J. Matossian
A.1 Introduction
A.2 Summary
A.3 Detailed Listing of the World-Wide Issued Patents

Appendix B. Constants and Formula

B1. Physical Constants
B2. Selected Conversion Factors of Units
B3. Lengths
B4. Frequencies
B5. Current Density
B6. Pressure

Appendix C. Frequently Used Acronyms

 

Appendix D. About the Authors

 

Name Index

Subject Index

* = coordinating author (for multi-author chapters)


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This page was last revised by André Anders on August 12, 2001.
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